35th ITG / GMM / GI -Workshop Test Methods and Reliability of Circuits and Systems

The workshop "Test Methods and Reliability of Circuits and Systems", organized by the Gesellschaft für Informatik, the VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik and the Informationstechnische Gesellschaft im VDE, is the most important German-speaking forum to discuss trends, results and current problems in the field of test, diagnosis and reliability of digital, analog, mixed-signal and RF circuits. The exchange of ideas is an important concern of the workshop.