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Hauptinhalt

Workshop-Programm
Montag, 22. Februar 2021
Zeit | |
---|---|
8:45 - 9:00 Uhr | Begrüßung |
9:00 - 10:00 Uhr | Keynote More Compute Performance under the Hood: New Applications and Complexity Challenges for Automotive Microcontrollers Christian Pacha Senior Principal, Head SoC Architecture, Infineon, Germany |
10:15 - 11:15 Uhr | Session 1: Application of new test standards |
Test Scheduling Optimization Model for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability Payan Habiby University of Bremen, Germany Sebastian Huhn University of Bremen and Cyber-Physical Systems, DFKI GmbH Rolf Drechsler University of Bremen and Cyber-Physical Systems, DFKI GmbH | |
Testing 3D stacks - IEEE 1838 Michael Günter Wahl University of Siegen, Germany | |
Pause | |
11:30 - 12:30 Uhr | Session 2: Analog Mixed-Signal Test |
Terminalsystem 2.0: Neue flexible Möglichkeiten der Kombination von PXI-Testerressourcen bis 1 GHz Björn Bieske IMMS GmbH, Germany Ludwig Kircher TU Ilmenau Alexander Rolapp IMMS GmbH, Germany | |
Novell UWB-Sub-Nanosecond Pulse Modulation Concept Alexander Stephan Oleszczuk eesy-IC GmbH, Germany Robert Weigel Friedrich-Alexander-Universität Erlangen, Germany | |
Pause | |
13:30 - 15:00 Uhr | Session 3: Safety |
Scalable Implementation of Functional Path Ring Oscillator for MCU Performance Screening Tobias Kilian Infineon Technologies AG and Technical University of Munich, Germany Heiko Ahrens Infineon Technologies AG, Neubiberg, Germany Daniel Tille Infineon Technologies AG, Neubiberg, Germany Martin Huch Infineon Technologies AG, Neubiberg, Germany Ulf Schlichtmann Technical University of Munich, Germany | |
Towards an Automated Flow for Implementation of Dedicated LBIST Scan Chains for Functional Safety Alessio Ciarciá Infineon Technologies, Germany and Politecnico di Torino, Torino, Italy Daniel Tille Infineon Technologies, Munich, Germany Paolo Bernardi Politecnico di Torino, Torino, Italy | |
Efficient Post-Silicon Run-Time Error Detection for Systems-on-Chip Sebastian Pointner Institute for Integrated Circuits, Johannes Kepler University Linz, Austria Martin Brunner Infineon Technologies Linz, Austria Rainer Findenig Infineon Technologies Linz, Austria Robert Wille Institute for Integrated Circuits, Johannes Kepler University Linz, Austria | |
Pause | |
15:15 - 16:45 Uhr | Special Session: Results from the RESCUE-Project |
RESCUE ITN: Challenges of Integrating Reliability, Security and Quality in Nanoelectronic Systems Maksim Jenihhin Tallinn University of Technology | |
Run-time Management of Hardware Redundancy for Mixed-Critical Applications Raphael Segabinazzi Ferreira, Jörg Nolte Brandenburg University of Technology Cottbus-Senftenberg | |
Run-Time Reliability Management in Coarse-Grained Reconfigurable Architectures Marcelo Brandalero, Michael Hübner Brandenburg University of Technology Cottbus-Senftenberg | |
18:00 - 19:30 Uhr | Virtual Get Together |
Dienstag, 23. Februar 2021
Zeit | |
8:30 - 9:30 Uhr | Keynote Low cost solutions for increasing system reliability on multi-core based safety-critical applications Ernesto Sanchez Politecnico di Torino, Italy |
9:30 - 10:30 Uhr | Poster Session |
Zuverlässigkeitsanalyse digitaler Schaltungen durch Answer Set Programming Anselm Breitenreiter IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany Oliver Schrape IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany Marko Andjelkovic IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany Milos Krstic IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany University of Potsdam, Germany | |
Assessing AFEDC Architecture's Robustness to Timing Faults Felipe A. Kuentzer IHP - Leibniz-Institut für innovative Mikroelektronik, Department of Computer Science, University of Potsdam Milos Krstic IHP - Leibniz-Institut für innovative Mikroelektronik, Department of Computer Science, University of Potsdam, Germany | |
Immunität eingebetteter verteilter Systeme gegen ROP-Angriffe durch Mutationen Peter Tabatt Hochschule Nordhausen Mario Schölzel Hochschule Nordhausen Kai Lehniger IHP - Leibniz-Institut für innovative Mikroelektronik | |
Mit konventioneller Technologie zum strahlungsharten AMS-Design Oliver Schrape IHP - Leibniz-Institut für innovative Mikroelektronik Anselm Breitenreiter IHP - Leibniz-Institut für innovative Mikroelektronik, Germany Li Lu IHP - Leibniz-Institut für innovative Mikroelektronik, Germany Ernesto Pun Garcia Arquimea, Madrid, Spanien Milos Krstic IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany University of Potsdam, Germany | |
Toward Utilizing Self-awareness During System-level Test Denis Schwachhofer Institute of Software Engineering, University of Stuttgart, Germany Institute of Computer Engineering and Computer Architecture, University of Stuttgart, Germany Steffen Becker Institute of Software Engineering, University of Stuttgart, Germany Matthias Sauer Advantest Europe, Boeblingen, Germany Stefan Wagner Institute of Software Engineering, University of Stuttgart, Germany Ilia Polian Institute of Computer Engineering and Computer Architecture, University of Stuttgart, Germany | |
Pause | |
10:45 - 11:45 Uhr | Session 4: Simulation of modern Technologies |
Fault Analysis of Homogeneously and Heterogeneously Quantized Deep Neural Networks Rizwan Tariq Syed IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany Markus Ulbricht IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany Milos Krstic University Potsdam, Germany IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany | |
Behavioral Simulation of Dot-Product Engine Implemented with ITIR Memristor Crossbar Including Assessment Jianan Wen IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany Markus Ulbricht IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany Xin Fan IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany RWTH Aachen University, Aaachen, Germany Milos Krstic IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany University of Potsdam, Germany | |
Pause | |
12:00 - 13:00 Uhr | Session 5: Codes and Security |
Kürzen von BCH-Codes zur Reduzierung der Anzahl der Prüfbits G. Duchrau Universität Potsdam, Germany M. Gössel Universität Potsdam, Germany | |
Lightweight Packet Monitoring for Flooding DoS Attack Detection in NoC-based MPSoCs Cesar G. Chaves Tallinn University of Technology, Tallinn, Estonia Frankfurt University of Applied Sciences, Frankfurt, Germany Johanna Sepùlveda Airbus Defence and Space, Munich, Germany Technical University of Munich, Munich, Germany Thomas Hollstein Frankfurt University of Applied Sciences, Frankfurt, Germany Tallinn University of Technology, Tallinn, Estonia | |
13:00 - 13:15 Uhr | Closing |